Name: New Keysight B1500A Semiconductor Device - XRFInstrument
SKU: XRF0952
Price: 32904 USD
Availability: InStock

Description

Keysight (Agilent) B1500A Semiconductor Device Analyzer

The Keysight B1500A Semiconductor Device Analyzer is an advanced, all-in-one instrument designed for precise electrical characterization of semiconductor devices and materials. Built with flexibility and scalability in mind, the B1500A is an industry-leading solution for research, development, and production testing of modern semiconductor technologies, including transistors, diodes, MEMS, and nano-scale devices.

keysight b1500a

Key Features & Capabilities

Modular & Scalable Architecture
The B1500A is fully modular, allowing users to configure the system to meet specific testing requirements. It supports up to 10 measurement modules, including Source/Measure Units (SMUs), capacitance measurement units, and fast waveform generators.
High-Precision Source/Measure Capabilities
Equipped with ultra-low current and high-voltage measurement capabilities, the analyzer supports voltage ranges from ±1 µV to ±200 V and current measurements from ±1 fA to ±1 A, making it ideal for low-leakage and high-power applications.
Advanced Measurement Modes
- IV (Current-Voltage) & CV (Capacitance-Voltage) Characterization
- Pulsed IV & Fast IV Measurements for capturing transient device behavior
- Quasi-Static CV (QS-CV) & High-Frequency CV (HF-CV) Analysis
- Multi-Channel and Parallel Measurements to optimize test efficiency
Easy-to-Use Interface with Integrated Software
The system features an intuitive Windows-based GUI (EasyEXPERT group+), providing a graphical, scriptable, and automated testing environment. Users can develop, execute, and analyze test results without the need for extensive programming knowledge.
Wide Application Range
The B1500A is ideal for:
- Semiconductor material research and failure analysis
- IV/CV characterization of MOSFETs, BJTs, diodes, and MEMS devices
- OLED, TFT, and photovoltaic material testing
- Reliability testing and advanced failure analysis
Seamless Integration with Probe Stations & Wafer Testing
Compatible with major wafer probing systems, enabling precise on-wafer and packaged device testing with low-noise and high-speed measurements.
Reliability & Compliance
The system adheres to industry-standard semiconductor testing methodologies and ensures compliance with international measurement standards, making it a trusted choice for universities, R&D labs, and semiconductor manufacturers.

Technical Specifications Overview

Parameter	Specification
Voltage Range	±1 µV to ±200 V
Current Range	±1 fA to ±1 A
Capacitance	Up to 5 MHz (with CV measurement unit)
SMUs Supported	Up to 10 slots available
Pulsed IV	Sub-microsecond resolution
Control Software	EasyEXPERT group+ (GUI-based)

Why Choose the Keysight B1500A?

Industry-proven solution for comprehensive semiconductor characterization
Flexible and scalable system with modular expandability
Unmatched precision with low-noise, high-speed measurements
Intuitive software interface, reducing setup time and complexity
Trusted by leading research institutions and semiconductor manufacturers worldwide

With its powerful features and high-precision measurement capabilities, the Keysight (Agilent) B1500A remains one of the most reliable and versatile semiconductor device analyzers available today.

Features and benefits :

Superior IV measurement performance: 0.1 fA / 0.5 µV measurement resolution

Measurement features include single and multi-channel sweep, time sampling, list sweep, quasi-static CV (using the SMUs), direct control and arbitrary linear waveform generation (ALWG) GUI for the HV-SPGUs.

Optional, integrated capacitance module supports CV measurements up to 5 MHz

Optional positioner-based CV-IV switching solutions available with 0.5 µV voltage measurement resolution and 10 fA, 1 fA or 0.1 fA current measurement resolution capability

Easy test automation with built-in semiautomatic wafer prober drivers and test sequencing without programming via the Quick Test mode

Optional high-voltage semiconductor pulse generator unit (HV-SPGU) available with 10 ns programmable pulse widths and +/- 40 V (80 V peak-to-peak) output.

Optional waveform generator/fast measurement unit (WGFMU) available with ALWG and fast current or voltage measurement capabilities.

10 ns pulsed IV solution is available for characterizing high-k gate dielectric and SOI (silicon-on-insulator) transistors.

A Classic Test mode is available to provide the look, feel, and terminology of the 4155/4156 interface while enhancing user interaction by taking full advantage of Microsoft ® Windows ® GUI features