New Agilent HP E8356A 300 kHz – 3 GHz VNA

Description

Agilent HP E8356A 300 kHz – 3 GHz Vector Network Analyzer 

The Agilent HP E8356A is a high-performance Vector Network Analyzer (VNA) designed for precise RF and microwave measurements across a 300 kHz to 3 GHz frequency range. Part of the PNA Series, this VNA offers exceptional accuracy, speed, and flexibility, making it an ideal choice for R&D, production testing, and network analysis applications.

With advanced calibration techniques, high dynamic range, and fast measurement speeds, the E8356A enables comprehensive S-parameter analysis of antennas, filters, amplifiers, and other RF components. Its intuitive user interface, large color display, and automated testing capabilities enhance productivity, ensuring repeatable and precise measurements.

Key Features & Benefits:

✅ Broad Frequency Range (300 kHz – 3 GHz) – Ideal for testing low-frequency and microwave RF components with high precision.

✅ Full 2-Port Vector Network Analysis – Provides accurate S-parameter measurements (S11, S12, S21, S22) for complete device characterization.

✅ High Dynamic Range & Accuracy –

• Dynamic range: > 123 dB
• Power range: -85 dBm to +10 dBm
• Frequency accuracy: ±0.01 ppm

✅ Fast Measurement Speed – Enables rapid swept frequency and power measurements, reducing testing time in production environments.

✅ Advanced Calibration Options – Supports SOLT, TRL, and ECal calibration methods, ensuring high measurement accuracy and repeatability.

✅ Large Touchscreen Display & Intuitive Interface – Provides real-time data visualization and easy navigation through measurement settings.

✅ Flexible Connectivity & Remote Control –

• Interfaces: GPIB, LAN, USB
• Remote control support for automated testing via SCPI commands.

✅ Modular & Upgradable – Supports additional software options for enhanced analysis and compatibility with active and passive device testing.

Applications:

• Antenna & RF Component Testing – Precise analysis of filters, couplers, duplexers, and amplifiers.
• R&D & Design Verification – Essential for developing and validating RF circuits.
• Production Line Testing – Fast and accurate testing for manufacturing quality control.
• Material & Network Analysis – Used in impedance characterization and wave propagation studies.

The Agilent HP E8356A Vector Network Analyzer is a powerful and reliable RF testing solution, delivering high accuracy, speed, and versatility for engineers, researchers, and manufacturers working with RF and microwave devices.

Specifications

General Specifications:

• Model: Agilent HP E8356A
• Type: Vector Network Analyzer (VNA)
• Frequency Range: 300 kHz to 3 GHz
• Test Ports: 2-port, fully reversible
• Measurement Parameters: S11, S12, S21, S22 (full S-parameter analysis)
• Dynamic Range: >123 dB @ 10 Hz IF bandwidth
• Power Range: -85 dBm to +10 dBm
• Frequency Accuracy: ±0.01 ppm

Performance & Measurement Capabilities:

• Sweep Types:
  • Linear frequency
  • Log frequency
  • Power sweep
  • Time domain
• Measurement Speed: <10 µs per point
• Output Power Range: -85 dBm to +10 dBm (adjustable)
• Trace Noise: < 0.006 dB RMS (IFBW 10 kHz)
• Impedance: 50 Ω

Calibration & Accuracy:

• Calibration Methods:
  • SOLT (Short-Open-Load-Thru)
  • TRL (Thru-Reflect-Line)
  • ECal (Electronic Calibration)
• Measurement Uncertainty: <0.005 dB (typical)
• Phase Stability: < 0.05°

Connectivity & Automation:

• Interfaces:
  • GPIB
  • LAN
  • USB
• Remote Control: Supports SCPI commands for automation
• Data Export Formats: CSV, Touchstone, S2P

Display & User Interface:

• Screen: Large color touchscreen with graphical UI
• Markers & Analysis: Multi-marker support, trace math, data averaging

Physical & Environmental Specifications:

• Dimensions: 426 mm (W) × 266 mm (H) × 451 mm (D)
• Weight: Approx. 20 kg
• Operating Temperature: 0°C to 50°C
• Power Requirements: 100-240V AC, 50/60 Hz

The Agilent HP E8356A is a high-precision Vector Network Analyzer with fast, accurate RF testing capabilities, ideal for S-parameter measurements, impedance characterization, and RF component analysis in research, development, and production environments.