Agilent 4155C Semiconductor Parameter Analyzer

The Agilent 4155C Semiconductor Parameter Analyzer is a sophisticated and high-precision test instrument designed to analyze the electrical characteristics of semiconductor devices, such as diodes, transistors, and integrated circuits (ICs). A part of the renowned 4150/4155 series from Agilent (now Keysight Technologies), the 4155C offers a wide range of measurement capabilities to support the development, testing, and production of semiconductor devices. It is ideal for use in research and development (R&D), quality control, and production testing environments.

Key Features:

• Wide Measurement Range: The Agilent 4155C offers a broad range of voltage and current measurement capabilities. It can handle both low-current measurements in the nanoampere range and high-current measurements up to several amps, making it versatile for a wide array of semiconductor components and devices.
• Multi-Channel Configuration: The analyzer can support multiple channels (up to 4), allowing for simultaneous testing of multiple devices under different conditions. This feature enhances throughput and efficiency during testing.
• High-Precision and Accuracy: With its advanced measurement technology, the 4155C ensures accurate, reliable, and repeatable results. It can measure electrical parameters such as current-voltage (I-V) characteristics, capacitance-voltage (C-V) characteristics, and other key semiconductor device characteristics with high precision.
• Flexible Test Setup: The analyzer provides users with flexibility in configuring tests. It allows for DC, pulsed, and transient measurements, enabling comprehensive testing across a variety of device types and operating conditions.
• Comprehensive Measurement Functions:
  • I-V (Current-Voltage) Measurement: Measures the I-V characteristics of semiconductor devices, including forward and reverse bias characteristics, breakdown voltages, and saturation currents.
  • C-V (Capacitance-Voltage) Measurement: Supports accurate measurement of capacitance versus voltage for semiconductor capacitors, MOSFETs, and other semiconductor devices.
  • Pulse Testing: Provides pulse measurement capabilities for characterizing the switching behavior of devices under high-speed or pulsed operating conditions.
  • Device Simulation: The analyzer can be used to simulate and evaluate the behavior of complex semiconductor devices, including transistors, diodes, and integrated circuits.
• Easy-to-Use Interface: Equipped with a user-friendly interface, the 4155C allows users to quickly set up and execute tests with minimal training. The intuitive graphical display and touch-screen interface make it easy to view results, configure tests, and analyze data in real-time.
• Advanced Data Analysis: The 4155C includes built-in data analysis functions, such as curve fitting, analysis of I-V and C-V data, and automatic extraction of parameters such as threshold voltage, subthreshold slope, and series resistance.
• Automated Testing and Integration: The analyzer supports automation with a variety of external control options, including GPIB (IEEE 488) and remote control via LAN or RS-232. This makes it suitable for integration into automated test systems for high-throughput testing environments.
• Compact and Robust Design: The Agilent 4155C is designed to be compact, occupying minimal bench space, while offering high reliability and durability for use in both lab and production environments.

Applications:

• Semiconductor Device Development: The 4155C is used extensively in the design and testing of semiconductor devices, including transistors, diodes, solar cells, and integrated circuits. It allows engineers to evaluate device performance and validate designs.
• Process Control and Quality Assurance: Used in semiconductor manufacturing, the 4155C helps ensure that devices meet strict performance specifications and quality standards, identifying potential process-related issues early in the production cycle.
• Research and Development: In R&D environments, the 4155C provides the flexibility and precision needed to explore new semiconductor materials, technologies, and device architectures.
• Failure Analysis: The analyzer is often used for failure analysis in semiconductor components, helping engineers diagnose issues and optimize designs based on electrical performance characteristics.
• Educational Use: The instrument is also used in academic and research institutions to teach students about semiconductor physics, electrical characterization, and measurement techniques.

Benefits:

• High Precision and Versatility: With the ability to perform I-V, C-V, and pulse measurements, the Agilent 4155C is highly versatile, making it suitable for a broad range of semiconductor testing applications.
• Increased Productivity: The multi-channel capability, combined with automated test functions, ensures efficient, high-throughput testing in both R&D and production environments.
• Advanced Data Analysis Tools: Built-in data analysis and device modeling capabilities help users quickly extract critical parameters from measurements, facilitating deeper insights into device performance.
• Ease of Integration: The availability of GPIB, LAN, and RS-232 interfaces allows the 4155C to be easily integrated into automated testing systems for large-scale testing environments.
• Reliable and Robust: Designed for demanding test environments, the Agilent 4155C offers consistent and reliable performance, helping ensure high-quality results in production and research applications.

Specifications:

General Specifications:

• Measurement Type: Current-Voltage (I-V), Capacitance-Voltage (C-V), and Pulse Measurement
• Number of Channels: Up to 4 input channels for simultaneous testing
• Measurement Range:
  • Voltage: 1 mV to 200 V (depending on configuration)
  • Current: 1 nA to 1 A (depending on range)
• Maximum Power: 200 W (maximum power output for each channel)

I-V (Current-Voltage) Measurement:

• DC Measurement: Wide voltage range from 1 mV to 200 V, with current ranges from 1 nA to 1 A
• Accuracy:
  • Voltage Accuracy: ±0.01% of reading ±1 mV
  • Current Accuracy: ±0.02% of reading ±1 nA
• Compliance Voltage: 200 V per channel (adjustable)
• Voltage Resolution: 1 mV
• Current Resolution: 1 nA

C-V (Capacitance-Voltage) Measurement:

• Frequency Range: 1 kHz to 1 MHz
• Capacitance Range: 1 pF to 100 μF
• Accuracy:
  • Capacitance Accuracy: ±1% of reading
• Voltage Range for C-V: 1 mV to 100 V

Pulse Testing:

• Pulse Width: 1 μs to 100 ms (depending on voltage and current conditions)
• Pulse Rise/Fall Time: <50 ns (for fast pulse conditions)
• Accuracy:
  • Pulse Width Accuracy: ±1% of setting
  • Rise/Fall Time Accuracy: <1% of pulse width

Data Acquisition and Analysis:

• Sampling Rate: Up to 100 kS/s (100,000 samples per second)
• Data Logging: Capable of logging measurement data with a capacity of up to 10,000 data points per channel
• Analysis Functions: Curve fitting, threshold voltage, subthreshold slope, and extraction of other device parameters like series resistance and saturation current

Connectivity and Interfaces:

• GPIB (IEEE 488): For remote control and automation
• RS-232: Serial communication for remote control
• LAN: Ethernet connectivity for remote access
• USB: For data storage and transfer

Display:

• Display Type: High-resolution LCD screen
• Screen Size: 5.7 inches
• User Interface: Touchscreen interface with graphical display for real-time measurements and analysis

Power Supply:

• Input Voltage: 100-240 V AC, 50/60 Hz
• Power Consumption: Approx. 200 W

Environmental Conditions:

• Operating Temperature: 0°C to 40°C (32°F to 104°F)
• Storage Temperature: -20°C to 60°C (-4°F to 140°F)
• Humidity: 20% to 80% (non-condensing)

Physical Dimensions:

• Dimensions (W x H x D): 428 mm x 130 mm x 350 mm
• Weight: Approx. 10 kg (22 lbs)

Additional Features:

• Built-in Data Analysis: Includes built-in analysis tools for extracting key parameters such as threshold voltage, subthreshold slope, and other device-specific characteristics.
• Automated Testing: Full support for automated testing and integration into larger test systems using standard communication interfaces (GPIB, LAN, etc.).
• Device Simulation: Capability to simulate complex semiconductor devices for performance evaluation.